Ultrafast dynamics of confined and localised excitons and
                biexcitons in low-dimensional semiconductors

Jørn Märcher Hvam; Wolfgang Langbein; Paola Borri; Kong T. Tsen

Ultrafast dynamics of confined and localised excitons and biexcitons in low-dimensional semiconductors

Jørn Märcher Hvam, Wolfgang Langbein, Paola Borri, Kong T. Tsen (Editor)

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.

Original language	English
Title of host publication	Ultrafast Phenomena in Semiconductors III, SPIE Proceedings 3624
Publisher	SPIE - The International Society for Optical Engineering
Publication date	1999
Pages	40-48
Publication status	Published - 1999

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title = "Ultrafast dynamics of confined and localised excitons and biexcitons in low-dimensional semiconductors",

abstract = "Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.",

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Ultrafast dynamics of confined and localised excitons and biexcitons in low-dimensional semiconductors. / Hvam, Jørn Märcher; Langbein, Wolfgang; Borri, Paola et al.
Ultrafast Phenomena in Semiconductors III, SPIE Proceedings 3624. SPIE - The International Society for Optical Engineering, 1999. p. 40-48.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Ultrafast dynamics of confined and localised excitons and biexcitons in low-dimensional semiconductors

AU - Hvam, Jørn Märcher

AU - Langbein, Wolfgang

AU - Borri, Paola

A2 - Tsen, Kong T.

PY - 1999

Y1 - 1999

N2 - Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.

AB - Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.

M3 - Article in proceedings

SP - 40

EP - 48

BT - Ultrafast Phenomena in Semiconductors III, SPIE Proceedings 3624

PB - SPIE - The International Society for Optical Engineering

ER -