Ultrafast dynamics of confined and localised excitons and biexcitons in low-dimensional semiconductors

Jørn Märcher Hvam, Wolfgang Langbein, Paola Borri, Kong T. Tsen (Editor)

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.
Original languageEnglish
Title of host publicationUltrafast Phenomena in Semiconductors III, SPIE Proceedings 3624
PublisherSPIE - The International Society for Optical Engineering
Publication date1999
Pages40-48
Publication statusPublished - 1999

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