Ultrafast carrier trapping in microcrystalline silicon observed in optical pump-terahertz probe measurements

Peter Uhd Jepsen, W. Schairer, I. H. Libon, U. Lemmer, N. E. Hecker, M. Birkholz, K. Lips, M. Schall

Research output: Contribution to journal › Journal article › Research › peer-review

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