Ultra-short-period WC/SiC multilayer coatings for x-ray applications

M.  Fernandez-Perea; M. J. Pivovaroff; R. Soufli; J. Alameda; P. Mirkarimi; M.-A. Descalle; S. L. Baker; T. McCarville; K. Ziock; D. Hornback; S. Romaine; R. Bruni; Z. Zhong; V. Honkimäki; E. Ziegler; Anders Clemen Jakobsen

doi:10.1016/j.nima.2012.10.066

Ultra-short-period WC/SiC multilayer coatings for x-ray applications

M. Fernandez-Perea, M. J. Pivovaroff, R. Soufli, J. Alameda, P. Mirkarimi, M.-A. Descalle, S. L. Baker, T. McCarville, K. Ziock, D. Hornback, S. Romaine, R. Bruni, Z. Zhong, V. Honkimäki, E. Ziegler, Anders Clemen Jakobsen

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

Multilayercoatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayercoatings to photon energies higher than previously achieved, we have developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.

Original language	English
Journal	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	710
Pages (from-to)	114-119
ISSN	0168-9002
DOIs	https://doi.org/10.1016/j.nima.2012.10.066
Publication status	Published - 2013
Event	4th International Workshop on Metrology for X-ray Optics - Barcelona, Spain Duration: 4 Jul 2012 → 6 Jul 2012 Conference number: 4

Conference

Conference	4th International Workshop on Metrology for X-ray Optics
Number	4
Country/Territory	Spain
City	Barcelona
Period	04/07/2012 → 06/07/2012

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Fernandez-Perea, M., Pivovaroff, M. J., Soufli, R., Alameda, J., Mirkarimi, P., Descalle, M.-A., Baker, S. L., McCarville, T., Ziock, K., Hornback, D., Romaine, S., Bruni, R., Zhong, Z., Honkimäki, V., Ziegler, E., & Jakobsen, A. C. (2013). Ultra-short-period WC/SiC multilayer coatings for x-ray applications. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 710, 114-119. https://doi.org/10.1016/j.nima.2012.10.066

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title = "Ultra-short-period WC/SiC multilayer coatings for x-ray applications",

abstract = "Multilayercoatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayercoatings to photon energies higher than previously achieved, we have developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.",

author = "M. Fernandez-Perea and Pivovaroff, {M. J.} and R. Soufli and J. Alameda and P. Mirkarimi and M.-A. Descalle and Baker, {S. L.} and T. McCarville and K. Ziock and D. Hornback and S. Romaine and R. Bruni and Z. Zhong and V. Honkim{\"a}ki and E. Ziegler and Jakobsen, {Anders Clemen}",

year = "2013",

doi = "10.1016/j.nima.2012.10.066",

language = "English",

volume = "710",

pages = "114--119",

journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier",

note = "4th International Workshop on Metrology for X-ray Optics, ACTOP ; Conference date: 04-07-2012 Through 06-07-2012",

}

Fernandez-Perea, M, Pivovaroff, MJ, Soufli, R, Alameda, J, Mirkarimi, P, Descalle, M-A, Baker, SL, McCarville, T, Ziock, K, Hornback, D, Romaine, S, Bruni, R, Zhong, Z, Honkimäki, V, Ziegler, E & Jakobsen, AC 2013, 'Ultra-short-period WC/SiC multilayer coatings for x-ray applications', Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 710, pp. 114-119. https://doi.org/10.1016/j.nima.2012.10.066

Ultra-short-period WC/SiC multilayer coatings for x-ray applications. / Fernandez-Perea, M. ; Pivovaroff, M. J.; Soufli, R. et al.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 710, 2013, p. 114-119.

Research output: Contribution to journal › Conference article › Research › peer-review

TY - GEN

T1 - Ultra-short-period WC/SiC multilayer coatings for x-ray applications

AU - Fernandez-Perea, M.

AU - Pivovaroff, M. J.

AU - Soufli, R.

AU - Alameda, J.

AU - Mirkarimi, P.

AU - Descalle, M.-A.

AU - Baker, S. L.

AU - McCarville, T.

AU - Ziock, K.

AU - Hornback, D.

AU - Romaine, S.

AU - Bruni, R.

AU - Zhong, Z.

AU - Honkimäki, V.

AU - Ziegler, E.

AU - Jakobsen, Anders Clemen

N1 - Conference code: 4

PY - 2013

Y1 - 2013

N2 - Multilayercoatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayercoatings to photon energies higher than previously achieved, we have developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.

AB - Multilayercoatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayercoatings to photon energies higher than previously achieved, we have developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.

U2 - 10.1016/j.nima.2012.10.066

DO - 10.1016/j.nima.2012.10.066

M3 - Conference article

SN - 0168-9002

VL - 710

SP - 114

EP - 119

JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

T2 - 4th International Workshop on Metrology for X-ray Optics

Y2 - 4 July 2012 through 6 July 2012

ER -

Ultra-short-period WC/SiC multilayer coatings for x-ray applications

Abstract

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