Ultra-short-period WC/SiC multilayer coatings for x-ray applications

M. Fernandez-Perea, M. J. Pivovaroff, R. Soufli, J. Alameda, P. Mirkarimi, M.-A. Descalle, S. L. Baker, T. McCarville, K. Ziock, D. Hornback, S. Romaine, R. Bruni, Z. Zhong, V. Honkimäki, E. Ziegler, Anders Clemen Jakobsen

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Multilayercoatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayercoatings to photon energies higher than previously achieved, we have developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV.
Original languageEnglish
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume710
Pages (from-to)114-119
ISSN0168-9002
DOIs
Publication statusPublished - 2013
Event4th international workshop on Metrology for X-ray Optics - Barcelona, Spain
Duration: 4 Jul 20126 Jul 2012
Conference number: 4

Conference

Conference4th international workshop on Metrology for X-ray Optics
Number4
CountrySpain
CityBarcelona
Period04/07/201206/07/2012

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