Ultra-low-angle boundary networks within recrystallizing grains

Sonja Rosenlund Ahl, Hugh Simons, Yubin Zhang, C. Detlefs, Frederik Stöhr, Anders Clemen Jakobsen, Dorte Juul Jensen, Henning Friis Poulsen

Research output: Contribution to journalJournal articleResearchpeer-review


We present direct evidence of a network of well-defined ultra-low-angle boundaries in bulk recrystallizing grains of 99.5% pure aluminium (AA1050) by means of a new, three-dimensional X-ray mapping technique; dark-field X-ray microscopy. These boundaries separate lattice orientation differences on the order of 0.05° and thus subdivide the recrystallizing grain into 2–7 μm wide domains. During further annealing the orientation differences decrease and the overall structure become more uniform while the network remains. It is observed that the morphology of the grain boundaries surrounding the recrystallizing grains relate to the intragranular network and effects hereof on the boundary migration is discussed.
Original languageEnglish
JournalScripta Materialia
Pages (from-to)87-91
Number of pages5
Publication statusPublished - 2017


  • Aluminium
  • Recrystallization
  • Recovery
  • X-ray diffraction (XRD)
  • Dark field X-ray microscopy (DFXRM)


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