Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy

Yu  Zhang; Yulin Gan; Wei  Niu; Kion Norrman; Xi  Yan; Dennis Valbjørn Christensen; Merlin von Soosten; Hongrui  Zhang; Baogen Shen; Nini Pryds; Jirong Sun; Yunzhong Chen

doi:10.1021/acsami.7b16510

Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy

Yu Zhang
, Yulin Gan
, Wei Niu
, Kion Norrman
, Xi Yan
, Dennis Valbjørn Christensen
, Merlin von Soosten
, Hongrui Zhang
, Baogen Shen
, Nini Pryds
, Jirong Sun
, Yunzhong Chen^*

^*Corresponding author for this work

Department of Energy Conversion and Storage

Chinese Academy of Sciences
Technical University of Denmark

Research output: Contribution to journal › Journal article › Research › peer-review

550 Downloads (Orbit)

Abstract

Chemical redox reaction can lead to a two-dimensional electron gas (2DEG) at the interface between a TiO2-terminated SrTiO3 (STO) substrate and an amorphous LaAlO3 (a-LAO) capping layer. When replacing the STO substrate with rutile and anatase TiO2 substrates, considerable differences in interfacial conduction are observed. Based on X-ray photoelectron spectroscopy (XPS) and transport measurements, we conclude that the interfacial conduction comes from redox reactions, and that the differences among the materials systems result mainly from variations in the activation energies for the diffusion of oxygen vacancies at substrate surfaces.

Original language	English
Journal	A C S Applied Materials and Interfaces
Volume	10
Issue number	1
Pages (from-to)	1434-1439
ISSN	1944-8244
DOIs	https://doi.org/10.1021/acsami.7b16510
Publication status	Published - 2018

Access to Document

10.1021/acsami.7b16510

Tuning the Two Dimensional Electron Gas at Oxide Interfaces with Ti O Configurations Evidence from X ray Photoelectron SpectroscopyAccepted author manuscript, 1.05 MB

OpenUrl availability

Check availability in DTU Findit

Cite this

Zhang, Y., Gan, Y., Niu, W., Norrman, K., Yan, X., Christensen, D. V., von Soosten, M., Zhang, H., Shen, B., Pryds, N., Sun, J., & Chen, Y. (2018). Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy. A C S Applied Materials and Interfaces, 10(1), 1434-1439. https://doi.org/10.1021/acsami.7b16510

@article{4c93e854c2a94f398aaa1fa451d1992e,

title = "Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy",

abstract = "Chemical redox reaction can lead to a two-dimensional electron gas (2DEG) at the interface between a TiO2-terminated SrTiO3 (STO) substrate and an amorphous LaAlO3 (a-LAO) capping layer. When replacing the STO substrate with rutile and anatase TiO2 substrates, considerable differences in interfacial conduction are observed. Based on X-ray photoelectron spectroscopy (XPS) and transport measurements, we conclude that the interfacial conduction comes from redox reactions, and that the differences among the materials systems result mainly from variations in the activation energies for the diffusion of oxygen vacancies at substrate surfaces.",

author = "Yu Zhang and Yulin Gan and Wei Niu and Kion Norrman and Xi Yan and Christensen, \{Dennis Valbj{\o}rn\} and \{von Soosten\}, Merlin and Hongrui Zhang and Baogen Shen and Nini Pryds and Jirong Sun and Yunzhong Chen",

year = "2018",

doi = "10.1021/acsami.7b16510",

language = "English",

volume = "10",

pages = "1434--1439",

journal = "A C S Applied Materials and Interfaces",

issn = "1944-8244",

publisher = "American Chemical Society",

number = "1",

}

Zhang, Y, Gan, Y, Niu, W, Norrman, K, Yan, X, Christensen, DV, von Soosten, M, Zhang, H, Shen, B, Pryds, N, Sun, J & Chen, Y 2018, 'Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy', A C S Applied Materials and Interfaces, vol. 10, no. 1, pp. 1434-1439. https://doi.org/10.1021/acsami.7b16510

TY - JOUR

T1 - Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy

AU - Zhang, Yu

AU - Gan, Yulin

AU - Niu, Wei

AU - Norrman, Kion

AU - Yan, Xi

AU - Christensen, Dennis Valbjørn

AU - von Soosten, Merlin

AU - Zhang, Hongrui

AU - Shen, Baogen

AU - Pryds, Nini

AU - Sun, Jirong

AU - Chen, Yunzhong

PY - 2018

Y1 - 2018

N2 - Chemical redox reaction can lead to a two-dimensional electron gas (2DEG) at the interface between a TiO2-terminated SrTiO3 (STO) substrate and an amorphous LaAlO3 (a-LAO) capping layer. When replacing the STO substrate with rutile and anatase TiO2 substrates, considerable differences in interfacial conduction are observed. Based on X-ray photoelectron spectroscopy (XPS) and transport measurements, we conclude that the interfacial conduction comes from redox reactions, and that the differences among the materials systems result mainly from variations in the activation energies for the diffusion of oxygen vacancies at substrate surfaces.

AB - Chemical redox reaction can lead to a two-dimensional electron gas (2DEG) at the interface between a TiO2-terminated SrTiO3 (STO) substrate and an amorphous LaAlO3 (a-LAO) capping layer. When replacing the STO substrate with rutile and anatase TiO2 substrates, considerable differences in interfacial conduction are observed. Based on X-ray photoelectron spectroscopy (XPS) and transport measurements, we conclude that the interfacial conduction comes from redox reactions, and that the differences among the materials systems result mainly from variations in the activation energies for the diffusion of oxygen vacancies at substrate surfaces.

U2 - 10.1021/acsami.7b16510

DO - 10.1021/acsami.7b16510

M3 - Journal article

C2 - 29226677

SN - 1944-8244

VL - 10

SP - 1434

EP - 1439

JO - A C S Applied Materials and Interfaces

JF - A C S Applied Materials and Interfaces

IS - 1

ER -

Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti-O Configurations: Evidence from X-ray Photoelectron Spectroscopy

Abstract

Access to Document

OpenUrl availability

Fingerprint

Cite this