Transient Measurements with a Photoconductively Gated Scanning
                Tunneling Microscope

Ulrich Dieter Felix Keil; Jacob Riis Jensen; Jørn Marcher Hvam

Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope

Ulrich Dieter Felix Keil, Jacob Riis Jensen, Jørn Marcher Hvam

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

Original language	English
Title of host publication	International Topical Meeting on Microwave Photonics. MWP '97, Technical digest
Place of Publication	Duisburg/Essen, Germany
Publication date	1997
Pages	285-287
Publication status	Published - 1997
Event	International Topical Meeting on Microwave Photonics. MWP '97 - Duisburg/Essen, Germany Duration: 1 Jan 1997 → …

Conference

Conference	International Topical Meeting on Microwave Photonics. MWP '97
City	Duisburg/Essen, Germany
Period	01/01/1997 → …

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@inbook{25e1dd458d374fe588dba99d6539752a,

title = "Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope",

author = "Keil, {Ulrich Dieter Felix} and Jensen, {Jacob Riis} and Hvam, {J{\o}rn Marcher}",

year = "1997",

language = "English",

pages = "285--287",

booktitle = "International Topical Meeting on Microwave Photonics. MWP '97, Technical digest",

note = "International Topical Meeting on Microwave Photonics. MWP '97 ; Conference date: 01-01-1997",

}

Keil, UDF, Jensen, JR & Hvam, JM 1997, Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope. in International Topical Meeting on Microwave Photonics. MWP '97, Technical digest. Duisburg/Essen, Germany, pp. 285-287, International Topical Meeting on Microwave Photonics. MWP '97, Duisburg/Essen, Germany, 01/01/1997.

Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope. / Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Marcher.
International Topical Meeting on Microwave Photonics. MWP '97, Technical digest. Duisburg/Essen, Germany, 1997. p. 285-287.

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

TY - CHAP

T1 - Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope

AU - Keil, Ulrich Dieter Felix

AU - Jensen, Jacob Riis

AU - Hvam, Jørn Marcher

PY - 1997

Y1 - 1997

M3 - Book chapter

SP - 285

EP - 287

BT - International Topical Meeting on Microwave Photonics. MWP '97, Technical digest

CY - Duisburg/Essen, Germany

T2 - International Topical Meeting on Microwave Photonics. MWP '97

Y2 - 1 January 1997

ER -