Transient field measurements with an ultrafast scanning tunneling microscope on photo-excited semiconductor layers

Ulrich Dieter Felix Keil

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationTransient field measurements with an ultrafast scanning tunneling microscope on photo-excited semiconductor layers
    PublisherIEEE
    Publication date1998
    Publication statusPublished - 1998
    EventEuropean Quantum Electronics Conference - Glasgow, United Kingdom
    Duration: 14 Sep 199818 Sep 1998

    Conference

    ConferenceEuropean Quantum Electronics Conference
    CountryUnited Kingdom
    CityGlasgow
    Period14/09/199818/09/1998

    Cite this

    Keil, U. D. F. (1998). Transient field measurements with an ultrafast scanning tunneling microscope on photo-excited semiconductor layers. In Transient field measurements with an ultrafast scanning tunneling microscope on photo-excited semiconductor layers IEEE.