Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Article number	470
Journal	Electrochemical Society. Meeting Abstracts (Online)
Volume	MA2013-01
ISSN	2151-2043
Publication status	Published - 2013
Event	223rd Electrochemical Society Meeting - Toronto, Canada Duration: 12 May 2013 → 16 May 2013 Conference number: 223

Conference	223rd Electrochemical Society Meeting
Number	223
Country/Territory	Canada
City	Toronto
Period	12/05/2013 → 16/05/2013

OpenUrl availability

@article{856d28dc5136413388f579878a2ac85a,

title = "Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities",

author = "Wolff-Ragnar Kiebach",

year = "2013",

language = "English",

volume = "MA2013-01",

journal = "Electrochemical Society. Meeting Abstracts (Online)",

issn = "2151-2043",

note = "223rd Electrochemical Society Meeting, ECS ; Conference date: 12-05-2013 Through 16-05-2013",

}

TY - ABST

T1 - Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities

AU - Kiebach, Wolff-Ragnar

N1 - Conference code: 223

PY - 2013

Y1 - 2013

M3 - Conference abstract in journal

SN - 2151-2043

VL - MA2013-01

JO - Electrochemical Society. Meeting Abstracts (Online)

JF - Electrochemical Society. Meeting Abstracts (Online)

M1 - 470

T2 - 223rd Electrochemical Society Meeting

Y2 - 12 May 2013 through 16 May 2013

ER -