Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities

Research output: Contribution to journalConference abstract in journalResearchpeer-review

Original languageEnglish
Article number470
JournalElectrochemical Society. Meeting Abstracts (Online)
VolumeMA2013-01
ISSN2151-2043
Publication statusPublished - 2013
Event223rd Electrochemical Society Meeting - Toronto, Canada
Duration: 12 May 201316 May 2013
Conference number: 223

Conference

Conference223rd Electrochemical Society Meeting
Number223
Country/TerritoryCanada
CityToronto
Period12/05/201316/05/2013

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