Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities

Research output: Contribution to journalConference abstract in journalResearchpeer-review

Original languageEnglish
Article number470
JournalElectrochemical Society. Meeting Abstracts (Online)
VolumeMA2013-01
ISSN2151-2043
Publication statusPublished - 2013
Event223rd Electrochemical Society Meeting - Toronto, Canada
Duration: 12 May 201316 May 2013
Conference number: 223

Conference

Conference223rd Electrochemical Society Meeting
Number223
CountryCanada
CityToronto
Period12/05/201316/05/2013

Cite this

@article{856d28dc5136413388f579878a2ac85a,
title = "Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities",
author = "Wolff-Ragnar Kiebach",
year = "2013",
language = "English",
volume = "MA2013-01",
journal = "Electrochemical Society. Meeting Abstracts (Online)",
issn = "2151-2043",

}

Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities. / Kiebach, Wolff-Ragnar.

In: Electrochemical Society. Meeting Abstracts (Online), Vol. MA2013-01, 470, 2013.

Research output: Contribution to journalConference abstract in journalResearchpeer-review

TY - ABST

T1 - Towards robust and reliable SOEC cells and stacks: Understanding degradation phenomena occurring under high current densities

AU - Kiebach, Wolff-Ragnar

PY - 2013

Y1 - 2013

M3 - Conference abstract in journal

VL - MA2013-01

JO - Electrochemical Society. Meeting Abstracts (Online)

JF - Electrochemical Society. Meeting Abstracts (Online)

SN - 2151-2043

M1 - 470

ER -