Total reflection x-ray fluorescence spectrometry of metal samples using synchrotron radiation at SSRL

F. Hegedüs, P. Wobrauschek, W.F. Sommer, R.W. Ryon, C. Streli, P. Winkler, P. Ferguson, P. Kregsamer, R. Rieder, M. Victoria, A. Horsewell

    Research output: Contribution to journalJournal articleResearch

    Original languageEnglish
    JournalX-Ray Spectrom.
    Pages (from-to)277-280
    Publication statusPublished - 1993

    Cite this