Topology Optimization of Surface-enhanced Raman Scattering Substrates

Ying Pan; Rasmus E. Christiansen; Jerome Michon; Juejun Hu; Steven G. Johnson

doi:10.1063/5.0055148

Topology Optimization of Surface-enhanced Raman Scattering Substrates

Ying Pan, Rasmus E. Christiansen^*, Jerome Michon, Juejun Hu, Steven G. Johnson

^*Corresponding author for this work

NanoPhoton – Center for Nanophotonics

Massachusetts Institute of Technology

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Abstract

Surface-enhanced Raman spectroscopy is a powerful and versatile sensing method with a detection limit down to the single molecule level, given sufficiently high signal enhancement. In this article, we demonstrate how topology optimization (TopOpt) can be used for designing surface enhanced Raman scattering (SERS) substrates adhering to realistic fabrication constraints. As an example, we experimentally demonstrated a SERS enhancement factor of 5x10⁴for the 604 cm^-1Raman line of rhodamine 6G using metal nanostructures with a critical dimension of 20 nm. We then show that, by relaxing the fabrication minimum-feature-size constraint, TopOpt may be used to design SERS substrates with orders of magnitude larger enhancement factor. The results validate topology optimization as an effective method for engineering optimized SERS nanostructures adhering to fabrication limitations.

Original language	English
Article number	061601
Journal	Applied Physics Letters
Volume	119
Number of pages	6
ISSN	0003-6951
DOIs	https://doi.org/10.1063/5.0055148
Publication status	Published - 2021

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@article{e87ed08aab9b4f84aad758d07ae4a1a6,

title = "Topology Optimization of Surface-enhanced Raman Scattering Substrates",

abstract = "Surface-enhanced Raman spectroscopy is a powerful and versatile sensing method with a detection limit down to the single molecule level, given sufficiently high signal enhancement. In this article, we demonstrate how topology optimization (TopOpt) can be used for designing surface enhanced Raman scattering (SERS) substrates adhering to realistic fabrication constraints. As an example, we experimentally demonstrated a SERS enhancement factor of 5x104 for the 604 cm-1 Raman line of rhodamine 6G using metal nanostructures with a critical dimension of 20 nm. We then show that, by relaxing the fabrication minimum-feature-size constraint, TopOpt may be used to design SERS substrates with orders of magnitude larger enhancement factor. The results validate topology optimization as an effective method for engineering optimized SERS nanostructures adhering to fabrication limitations.",

author = "Ying Pan and Christiansen, {Rasmus E.} and Jerome Michon and Juejun Hu and Johnson, {Steven G.}",

year = "2021",

doi = "10.1063/5.0055148",

language = "English",

volume = "119",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Topology Optimization of Surface-enhanced Raman Scattering Substrates

AU - Pan, Ying

AU - Christiansen, Rasmus E.

AU - Michon, Jerome

AU - Hu, Juejun

AU - Johnson, Steven G.

PY - 2021

Y1 - 2021

N2 - Surface-enhanced Raman spectroscopy is a powerful and versatile sensing method with a detection limit down to the single molecule level, given sufficiently high signal enhancement. In this article, we demonstrate how topology optimization (TopOpt) can be used for designing surface enhanced Raman scattering (SERS) substrates adhering to realistic fabrication constraints. As an example, we experimentally demonstrated a SERS enhancement factor of 5x104 for the 604 cm-1 Raman line of rhodamine 6G using metal nanostructures with a critical dimension of 20 nm. We then show that, by relaxing the fabrication minimum-feature-size constraint, TopOpt may be used to design SERS substrates with orders of magnitude larger enhancement factor. The results validate topology optimization as an effective method for engineering optimized SERS nanostructures adhering to fabrication limitations.

AB - Surface-enhanced Raman spectroscopy is a powerful and versatile sensing method with a detection limit down to the single molecule level, given sufficiently high signal enhancement. In this article, we demonstrate how topology optimization (TopOpt) can be used for designing surface enhanced Raman scattering (SERS) substrates adhering to realistic fabrication constraints. As an example, we experimentally demonstrated a SERS enhancement factor of 5x104 for the 604 cm-1 Raman line of rhodamine 6G using metal nanostructures with a critical dimension of 20 nm. We then show that, by relaxing the fabrication minimum-feature-size constraint, TopOpt may be used to design SERS substrates with orders of magnitude larger enhancement factor. The results validate topology optimization as an effective method for engineering optimized SERS nanostructures adhering to fabrication limitations.

U2 - 10.1063/5.0055148

DO - 10.1063/5.0055148

M3 - Journal article

SN - 0003-6951

VL - 119

JO - Applied Physics Letters

JF - Applied Physics Letters

M1 - 061601

ER -

Topology Optimization of Surface-enhanced Raman Scattering Substrates

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