Topographic characterization of nanostructures on curved polymer surfaces

Nikolaj Agentoft Feidenhans'l, Jan C. Petersen, Rafael J. Taboryski

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review


    The availability of portable instrumentation for characterizing surface topography on the micro- and nanometer scale is very limited. Particular the handling of curved surfaces, both concave and convex, is complicated or not possible on current instrumentation. However, the currently growing use of injection moulding of polymer parts featuring nanostructured surfaces, requires an instrument that can characterize these structures to ensure replication-confidence between master structure and replicated polymer parts.
    This project concerns the development of a metrological traceable quality control method with a portable instrument that can be used in a production environment, and topographically characterize nanometer-scale surface structures on both flat and curved surfaces. To facilitate the commercialization of injection moulded polymer parts featuring nanostructures, it is pivotal that the instrument can characterize and validate the micro- and nanoscale topography directly in the production facility, as the interruptive time delay induced from shipping to an external facility is not compatible with present large-scale production routines. Satisfactory characterization of nanostructured curved surfaces in vibration prone production facilities has not previously been reported in the literature, and therefore has great novelty potential.

    Original languageEnglish
    Title of host publicationProceedings of Pittcon 2014
    Publication date2014
    Publication statusPublished - 2014
    EventPittcon 2014 - Chicago, United States
    Duration: 2 Mar 20146 Mar 2014


    ConferencePittcon 2014
    Country/TerritoryUnited States


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