TOF-SIMS studies of yttria-stabilised zirconia

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.
    Original languageEnglish
    JournalSurface and Interface Analysis
    Volume38
    Issue number5
    Pages (from-to)911-916
    ISSN0142-2421
    DOIs
    Publication statusPublished - 2006

    Cite this

    @article{212052947e184beb88adcb542e17596b,
    title = "TOF-SIMS studies of yttria-stabilised zirconia",
    abstract = "The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.",
    keywords = "Br{\ae}ndselsceller og brint",
    author = "Hansen, {Karin Vels} and Kion Norrman and Mogensen, {Mogens Bjerg}",
    year = "2006",
    doi = "10.1002/sia.2314",
    language = "English",
    volume = "38",
    pages = "911--916",
    journal = "Surface and Interface Analysis",
    issn = "0142-2421",
    publisher = "JohnWiley & Sons Ltd.",
    number = "5",

    }

    TOF-SIMS studies of yttria-stabilised zirconia. / Hansen, Karin Vels; Norrman, Kion; Mogensen, Mogens Bjerg.

    In: Surface and Interface Analysis, Vol. 38, No. 5, 2006, p. 911-916.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - TOF-SIMS studies of yttria-stabilised zirconia

    AU - Hansen, Karin Vels

    AU - Norrman, Kion

    AU - Mogensen, Mogens Bjerg

    PY - 2006

    Y1 - 2006

    N2 - The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.

    AB - The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.

    KW - Brændselsceller og brint

    U2 - 10.1002/sia.2314

    DO - 10.1002/sia.2314

    M3 - Journal article

    VL - 38

    SP - 911

    EP - 916

    JO - Surface and Interface Analysis

    JF - Surface and Interface Analysis

    SN - 0142-2421

    IS - 5

    ER -