TOF-SIMS studies of yttria-stabilised zirconia

Karin Vels Hansen; Kion Norrman; Mogens Bjerg Mogensen

doi:10.1002/sia.2314

TOF-SIMS studies of yttria-stabilised zirconia

Karin Vels Hansen, Kion Norrman, Mogens Bjerg Mogensen

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Abstract

The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.

Original language	English
Journal	Surface and Interface Analysis
Volume	38
Issue number	5
Pages (from-to)	911-916
ISSN	0142-2421
DOIs	https://doi.org/10.1002/sia.2314
Publication status	Published - 2006

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title = "TOF-SIMS studies of yttria-stabilised zirconia",

abstract = "The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd. ",

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N2 - The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.

AB - The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.

KW - Brændselsceller og brint

U2 - 10.1002/sia.2314

DO - 10.1002/sia.2314

M3 - Journal article

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VL - 38

SP - 911

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JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 5

ER -

TOF-SIMS studies of yttria-stabilised zirconia

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