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TNSPC: Learning from Partially Observed Data Using Tensor Network Structured Probabilistic Circuits

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Partially observed and heterogeneous data pose significant challenges in machine learning and statistical analysis, often leading to biased results or reduced model performance. While various imputation methods exist, they typically struggle with high-dimensional and mixed data types. To address these limitations, we introduce a flexible framework that leverages tensor network structures and probabilistic circuits (TNSPC) to provide an analytically tractable and scalable solution for imputing high-dimensional and mixed data types. Within the TNSPC framework, we systematically contrast the canonical polyadic (CP), tensor train (TT), and tensor tree network (TTN) structures to prominent probabilistic circuit structures not relying on tensor networks and find that the considered TNSPCs in general provide comparable performance and on some of the considered datasets even best performance. We further highlight the versatility of the TNSPC framework and its limitations.
Original languageEnglish
Title of host publicationProceedings of IEEE 35th International Workshop on Machine Learning for Signal Processing
Number of pages6
PublisherIEEE
Publication date2025
Article number11204307
ISBN (Print)979-8-3315-7030-9
DOIs
Publication statusPublished - 2025
Event35th IEEE International Workshop on Machine Learning for Signal Processing - Istanbul Lutfi Kirdar International Convention and Exhibition Centre, İstanbul, Turkey
Duration: 31 Aug 20253 Sept 2025

Conference

Conference35th IEEE International Workshop on Machine Learning for Signal Processing
LocationIstanbul Lutfi Kirdar International Convention and Exhibition Centre
Country/TerritoryTurkey
Cityİstanbul
Period31/08/202503/09/2025

Keywords

  • Analytical models
  • Tensors
  • Statistical analysis
  • Circuits
  • Estimation
  • Machine learning
  • Probabilistic logic
  • Imputation
  • Data models
  • Integrated circuit modeling

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