Timing jitter correction for THz-TDS measurements of graphene

Patrick Rebsdorf Whelan, Krzysztof Iwaszczuk, Peter Bøggild, Peter Uhd Jepsen

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

    Abstract

    We discuss how noncontact, quantitative large-area mapping of the conductance of thin films requires delicate corrections in order to deduce electrical properties such as graphene mobility from THz-TDS measurements.
    Original languageEnglish
    Title of host publicationProceedings of 41st International Conference on Infrared, Millimeter, and Terahertz Waves (2016)
    Number of pages1
    PublisherIEEE
    Publication date2016
    ISBN (Electronic)9781467384858
    DOIs
    Publication statusPublished - 2016
    Event41st International Conference on Infrared, Millimeter and Terahertz Waves - Copenhagen, Denmark
    Duration: 25 Sept 201630 Sept 2016
    Conference number: 41

    Conference

    Conference41st International Conference on Infrared, Millimeter and Terahertz Waves
    Number41
    Country/TerritoryDenmark
    CityCopenhagen
    Period25/09/201630/09/2016

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