Timing jitter correction for THz-TDS measurements of graphene

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Abstract

We discuss how noncontact, quantitative large-area mapping of the conductance of thin films requires delicate corrections in order to deduce electrical properties such as graphene mobility from THz-TDS measurements.
Original languageEnglish
Title of host publicationProceedings of 41st International Conference on Infrared, Millimeter, and Terahertz Waves (2016)
Number of pages1
PublisherIEEE
Publication date2016
ISBN (Electronic)9781467384858
DOIs
Publication statusPublished - 2016
Event41st International Conference on Infrared, Millimeter and Terahertz Waves - Copenhagen, Denmark
Duration: 25 Sep 201630 Sep 2016
Conference number: 41

Conference

Conference41st International Conference on Infrared, Millimeter and Terahertz Waves
Number41
CountryDenmark
CityCopenhagen
Period25/09/201630/09/2016

Cite this

Whelan, P. R., Iwaszczuk, K., Bøggild, P., & Jepsen, P. U. (2016). Timing jitter correction for THz-TDS measurements of graphene. In Proceedings of 41st International Conference on Infrared, Millimeter, and Terahertz Waves (2016) IEEE. https://doi.org/10.1109/IRMMW-THz.2016.7758548