Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission

Wolfgang Langbein; Jørn Märcher Hvam; R. Zimmermann; David Gershoni

Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission

Wolfgang Langbein, Jørn Märcher Hvam, R. Zimmermann, David Gershoni

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.

Original language	English
Title of host publication	Proceedings of the 24th International Conference on The Physics of Semiconductors
Place of Publication	Singapore
Publisher	World Scientific
Publication date	1998
Publication status	Published - 1998
Event	24th International Conference on The Physics of Semiconductors - Jerusalem, Israel Duration: 2 Aug 1998 → 7 Aug 1998 Conference number: 24 http://physics.technion.ac.il/~icps24/

Conference

Conference	24th International Conference on The Physics of Semiconductors
Number	24
Country/Territory	Israel
City	Jerusalem
Period	02/08/1998 → 07/08/1998
Internet address	http://physics.technion.ac.il/~icps24/

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title = "Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission",

abstract = "A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.",

author = "Wolfgang Langbein and Hvam, \{J{\o}rn M{\"a}rcher\} and R. Zimmermann and David Gershoni",

year = "1998",

language = "English",

booktitle = "Proceedings of the 24th International Conference on The Physics of Semiconductors",

publisher = "World Scientific",

address = "Singapore",

note = "24th International Conference on The Physics of Semiconductors, ICPS 24 ; Conference date: 02-08-1998 Through 07-08-1998",

url = "http://physics.technion.ac.il/\textasciitilde{}icps24/",

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Langbein, W, Hvam, JM, Zimmermann, R & Gershoni, D 1998, Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission. in Proceedings of the 24th International Conference on The Physics of Semiconductors. World Scientific, Singapore, 24th International Conference on The Physics of Semiconductors, Jerusalem, Israel, 02/08/1998.

Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission. / Langbein, Wolfgang; Hvam, Jørn Märcher; Zimmermann, R. et al.
Proceedings of the 24th International Conference on The Physics of Semiconductors. Singapore: World Scientific, 1998.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission

AU - Langbein, Wolfgang

AU - Hvam, Jørn Märcher

AU - Zimmermann, R.

AU - Gershoni, David

N1 - Conference code: 24

PY - 1998

Y1 - 1998

N2 - A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.

AB - A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.

M3 - Article in proceedings

BT - Proceedings of the 24th International Conference on The Physics of Semiconductors

PB - World Scientific

CY - Singapore

T2 - 24th International Conference on The Physics of Semiconductors

Y2 - 2 August 1998 through 7 August 1998

ER -

Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission

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