Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission

Wolfgang Langbein, Jørn Märcher Hvam, R. Zimmermann, David Gershoni

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Abstract

A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.
Original languageEnglish
Title of host publicationProceedings of the 24th International Conference on The Physics of Semiconductors
Place of PublicationSingapore
PublisherWorld Scientific
Publication date1998
Publication statusPublished - 1998
Event24th International Conference on The Physics of Semiconductors - Jerusalem, Israel
Duration: 2 Aug 19987 Aug 1998
Conference number: 24
http://physics.technion.ac.il/~icps24/

Conference

Conference24th International Conference on The Physics of Semiconductors
Number24
CountryIsrael
CityJerusalem
Period02/08/199807/08/1998
Internet address

Cite this

Langbein, W., Hvam, J. M., Zimmermann, R., & Gershoni, D. (1998). Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission. In Proceedings of the 24th International Conference on The Physics of Semiconductors World Scientific.