A new technique to analyze the time-dependent coherence of light emitted in a non-specular direction is presented. We demonstrate that the coherence degree of the emission can be deduced from the intensity fluctuations over the emission directions (speckles). The secondary emission of excitons in semiconductor quantum wells is investigated. Here, a partial coherence results from an interplay between scattering due to static disorder and inelastic relaxation, without any influence of the radiative decay. The temperature dependence is well explained by dephasing due to phonon scattering.
|Title of host publication||Proceedings of the 24th International Conference on The Physics of Semiconductors|
|Place of Publication||Singapore|
|Publication status||Published - 1998|
|Event||24th International Conference on The Physics of Semiconductors - Jerusalem, Israel|
Duration: 2 Aug 1998 → 7 Aug 1998
Conference number: 24
|Conference||24th International Conference on The Physics of Semiconductors|
|Period||02/08/1998 → 07/08/1998|
Langbein, W., Hvam, J. M., Zimmermann, R., & Gershoni, D. (1998). Timeresolved Speckle Analysis: Probing the Coherence of Excitonic Secondary Emission. In Proceedings of the 24th International Conference on The Physics of Semiconductors World Scientific.