Time-of-flight secondary ion mass spectrometry as a tool for studying segregation phenomena at nickel-YSZ interfaces

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Original language	English
Journal	Journal of the European Ceramic Society
Volume	26
Pages (from-to)	967-980
ISSN	0955-2219
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2004.12.030
Publication status	Published - 2006

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@article{2c0ca3e2384a46d588ef1b386066ea69,

title = "Time-of-flight secondary ion mass spectrometry as a tool for studying segregation phenomena at nickel-YSZ interfaces",

keywords = "Br{\ae}ndselsceller og brint",

author = "K. Norrman and K.V. Hansen and Mogensen, \{Mogens Bjerg\}",

year = "2006",

doi = "10.1016/j.jeurceramsoc.2004.12.030",

language = "English",

volume = "26",

pages = "967--980",

journal = "Journal of the European Ceramic Society",

issn = "0955-2219",

publisher = "Elsevier",

}

TY - JOUR

T1 - Time-of-flight secondary ion mass spectrometry as a tool for studying segregation phenomena at nickel-YSZ interfaces

AU - Norrman, K.

AU - Hansen, K.V.

AU - Mogensen, Mogens Bjerg

PY - 2006

Y1 - 2006

KW - Brændselsceller og brint

U2 - 10.1016/j.jeurceramsoc.2004.12.030

DO - 10.1016/j.jeurceramsoc.2004.12.030

M3 - Journal article

SN - 0955-2219

VL - 26

SP - 967

EP - 980

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

ER -