Original language | English |
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Journal | Journal of the European Ceramic Society |
Volume | 26 |
Pages (from-to) | 967-980 |
ISSN | 0955-2219 |
DOIs | |
Publication status | Published - 2006 |
Time-of-flight secondary ion mass spectrometry as a tool for studying segregation phenomena at nickel-YSZ interfaces
K. Norrman, K.V. Hansen, Mogens Bjerg Mogensen
Research output: Contribution to journal › Journal article › Research › peer-review