Time-of-flight secondary ion mass spectrometry as a tool for studying segregation phenomena at nickel-YSZ interfaces

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of the European Ceramic Society
    Volume26
    Pages (from-to)967-980
    ISSN0955-2219
    DOIs
    Publication statusPublished - 2006

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