Abstract
A theoretically developed relationship between partial discharges and the response from a system for dielectric spectroscopy was experimentally confirmed. The losses caused by the discharges were highest at test voltages with low frequencies. At 0.1 Hz, tanδ tip-up at discharge inception was very difficult to observe. A very clear tip-up could be seen by detection of the third harmonic in the current through the test object. This is much more sensitive to the detection of internal partial discharges than traditional loss measurements, in particular when using low frequency test voltages
Original language | English |
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Title of host publication | IEEE 1997 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena |
Volume | ´2 |
Publisher | IEEE |
Publication date | 1997 |
Pages | 498-503 |
ISBN (Print) | 0-7803-3851-0 |
DOIs | |
Publication status | Published - 1997 |
Event | Conference on Electrical Insulation and Dielectric Phenomena 1997 - Duration: 19 Oct 1997 → 22 Oct 1997 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5021 |
Conference
Conference | Conference on Electrical Insulation and Dielectric Phenomena 1997 |
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Period | 19/10/1997 → 22/10/1997 |
Internet address |