Time domain PD-detection vs. dielectric spectroscopy

Joachim T. Holbøll, Hans Edin, Uno Gäfvert

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    213 Downloads (Pure)

    Abstract

    A theoretically developed relationship between partial discharges and the response from a system for dielectric spectroscopy was experimentally confirmed. The losses caused by the discharges were highest at test voltages with low frequencies. At 0.1 Hz, tanδ tip-up at discharge inception was very difficult to observe. A very clear tip-up could be seen by detection of the third harmonic in the current through the test object. This is much more sensitive to the detection of internal partial discharges than traditional loss measurements, in particular when using low frequency test voltages
    Original languageEnglish
    Title of host publicationIEEE 1997 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena
    Volume´2
    PublisherIEEE
    Publication date1997
    Pages498-503
    ISBN (Print)0-7803-3851-0
    DOIs
    Publication statusPublished - 1997
    EventConference on Electrical Insulation and Dielectric Phenomena 1997 -
    Duration: 19 Oct 199722 Oct 1997
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5021

    Conference

    ConferenceConference on Electrical Insulation and Dielectric Phenomena 1997
    Period19/10/199722/10/1997
    Internet address

    Bibliographical note

    Copyright: 1997 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

    Cite this

    Holbøll, J. T., Edin, H., & Gäfvert, U. (1997). Time domain PD-detection vs. dielectric spectroscopy. In IEEE 1997 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena (Vol. ´2, pp. 498-503). IEEE. https://doi.org/10.1109/CEIDP.1997.641120