Abstract
THz time-domain spectroscopy (THz-TDS) is by now getting an established technique for the precise determination of the dielectric function of various materials in the terahertz spectral range of the electromagnetic spectrum. Typically, THz-TDS is carried out using planar samples. Examples include transmission spectroscopy of pressed pellets for the investigation of powder materials and wafer-like samples for spectroscopy of bulk and nanostructured semiconductor materials. Reflection-type spectroscopy is applied using plane interfaces for the study of liquids [1,2,3]. However, quantitative spectroscopy on samples with irregular shapes is very challenging due to the complicated interplay between spectroscopic signatures of the material and diffraction effects due to irregular sample geometry.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of International Workshop on Terahertz Science and Technology |
| Publisher | University of California Press |
| Publication date | 2009 |
| Publication status | Published - 2009 |
| Event | Optical Terahertz Science and Technology Meeting - Santa Barbara, CA, United States Duration: 7 Mar 2009 → 11 Mar 2009 |
Conference
| Conference | Optical Terahertz Science and Technology Meeting |
|---|---|
| Country/Territory | United States |
| City | Santa Barbara, CA |
| Period | 07/03/2009 → 11/03/2009 |
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