THz Generation Using Fluxon Dynamics in High Temperature Superconductors

Niels Falsig Pedersen; S. Madsen

doi:10.1109/TASC.2009.2018770

THz Generation Using Fluxon Dynamics in High Temperature Superconductors

Niels Falsig Pedersen, S. Madsen

Aarhus University

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

We consider THz emission due to fluxon dynamics in a stack of inductively coupled long Josephson junctions connected electrically to a resonant cavity. By comparing to experiments on Josephson junction parametric amplifiers we consider the role of a negative resistance in connection with THz emission experiments. We suggest that indeed the negative resistance has a big influence on the experimental results.

Original language	English
Journal	IEEE Transactions on Applied Superconductivity
Volume	19
Issue number	3
Pages (from-to)	726-729
ISSN	1051-8223
DOIs	https://doi.org/10.1109/TASC.2009.2018770
Publication status	Published - 2009

Keywords

negative resistance
BSCCO
THz oscillator

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10.1109/TASC.2009.2018770

http://www.ewh.ieee.org/tc/csc/europe/newsforum/pdf/PedersenN_1EC04.pdf

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KW - THz oscillator

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JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

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THz Generation Using Fluxon Dynamics in High Temperature Superconductors

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