Abstract
A new dopant incorporation mechanism in Ga-assisted GaAs nanowires grown by molecular beam epitaxy is reported. Off-axis electron holography revealed that p-type Be dopants introduced in situ during molecular beam epitaxy growth of the nanowires were distributed inhomogeneously in the nanowire cross-section, perpendicular to the growth direction. The active dopants showed a remarkable azimuthal distribution along the (111)B flat top of the nanowires, which is attributed to preferred incorporation along 3-fold symmetric truncated facets under the Ga droplet. A diffusion model is presented to explain the unique radial and azimuthal variation of the active dopants in the GaAs nanowires.
Original language | English |
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Journal | Nano Letters |
Volume | 17 |
Issue number | 10 |
Pages (from-to) | 5875-5882 |
Number of pages | 8 |
ISSN | 1530-6984 |
DOIs | |
Publication status | Published - 2017 |
Keywords
- GaAs
- Gallium arsenide
- Nanowires
- Self-assisted
- Molecular beam epitaxy
- Doping
- Beryllium