Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

Haihua Liu, Søren Schmidt, Henning Friis Poulsen, A. Godfrey, Z.Q. Liu, J.A. Sharon, Xiaoxu Huang

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture x-ray microscopy can now be used to generate 3D orientation maps with a spatial resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D orientation mapping in the transmission electron microscope of mono- and multiphase nanocrystalline materials with a spatial resolution reaching 1 nm. We demonstrate the technique by an experimental study of a nanocrystalline aluminum sample and use simulations to validate the principles involved
    Original languageEnglish
    JournalScience
    Volume332
    Issue number6031
    Pages (from-to)833-834
    ISSN0036-8075
    DOIs
    Publication statusPublished - 2011

    Keywords

    • Materials characterisation and modelling

    Cite this