Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

W. Ludwig, P. Reischig, A. King, M. Herbig, Erik Lauridsen Mejdal, G. Johnson, T.J. Marrow, J.Y. Buffiere

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    Abstract

    X-ray diffraction contrast tomography (DCT) is a technique for mapping grain shape and orientation in plastically undeformed polycrystals. In this paper, we describe a modified DCT data acquisition strategy which permits the incorporation of an innovative Friedel pair method for analyzing diffraction data. Diffraction spots are acquired during a 360 degrees rotation of the sample and are analyzed in terms of the Friedel pairs ((hkl) and (hkl) reflections, observed 180 degrees apart in rotation). The resulting increase in the accuracy with which the diffraction vectors are determined allows the use of improved algorithms for grain indexing (assigning diffraction spots to the grains from which they arise) and reconstruction. The accuracy of the resulting grain maps is quantified with reference to synchrotron microtomography data for a specimen made from a beta titanium system in which a second phase can be precipitated at grain boundaries, thereby revealing the grain shapes. The simple changes introduced to the DCT methodology are equally applicable to other variants of grain mapping. ©2009 American Institute of Physics
    Original languageEnglish
    JournalReview of Scientific Instruments
    Volume80
    Issue number3
    Pages (from-to)033905
    ISSN0034-6748
    DOIs
    Publication statusPublished - 2009

    Bibliographical note

    Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

    Keywords

    • tomography
    • synchrotron radiation
    • Materials characterization and modelling
    • Materials research
    • grain boundaries
    • data acquisition
    • X-ray diffraction

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