Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2

Lionel C. Gontard, Joerg R. Jinschek, Haiyan Ou, Jo Verbeeck, Rafal E. Dunin-Borkowski

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A focused electron beam in a scanning transmission electron microscope (STEM) is used to create arrays of core-shell structures in a specimen of amorphous SiO2 doped with Ge. The same electron microscope is then used to measure the changes that occurred in the specimen in three dimensions using electron tomography. The results show that transformations in insulators that have been subjected to intense irradiation using charged particles can be studied directly in three dimensions. The fabricated structures include core-shell nano-columns, sputtered regions, voids, and clusters. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4731765]
Original languageEnglish
JournalApplied Physics Letters
Volume100
Issue number26
Pages (from-to)263113
Number of pages4
ISSN0003-6951
DOIs
Publication statusPublished - 2012

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