Three-Dimensional Characterization of X-ray Refractive Optics

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Original languageEnglish
Title of host publicationProceedings of the 40th International Conference on Micro and Nano Engineering
Number of pages1
Publication date2014
Publication statusPublished - 2014
Event40th International Conference on Micro and Nano Engineering - Lausanne, Switzerland
Duration: 22 Sep 201426 Sep 2014
Conference number: 40
http://www.mne2014.org/

Conference

Conference40th International Conference on Micro and Nano Engineering
Number40
CountrySwitzerland
CityLausanne
Period22/09/201426/09/2014
Internet address

Keywords

  • X-ray optics
  • Optical profilometry
  • Atomic force microscopy
  • Replica molding

Cite this

Stöhr, F., Michael-Lindhard, J., Simons, H., Hübner, J., Jensen, F., Hansen, O., Garnæs, J., Snigirev, A., & Poulsen, H. F. (2014). Three-Dimensional Characterization of X-ray Refractive Optics. In Proceedings of the 40th International Conference on Micro and Nano Engineering