Threat detection of liquid explosives and precursors from their x-ray scattering pattern using energy dispersive detector technology

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Abstract

Energy dispersive X-ray diffraction (EDXRD) can be applied for identification of liquid threats in luggage scanning in security applications. To define the instrumental design, the framework for data reduction and analysis and test the performance of the threat detection in various scenarios, a flexible laboratory EDXRD test setup was build. A data set of overall 570 EDXRD spectra has been acquired for training and testing of threat identification algorithms. The EDXRD data was acquired with limited count statistics and at multiple detector angles and merged after correction and normalization. Initial testing of the threat detection algorithms with this data set indicate the feasibility of detection levels of > 95 % true positive with < 6 % false positive alarms.
Original languageEnglish
Title of host publicationProc. SPIE 10403, Infrared Remote Sensing and Instrumentation XXV
Number of pages9
Volume10391
PublisherSPIE - International Society for Optical Engineering
Publication date2017
Article number1039302
DOIs
Publication statusPublished - 2017
EventSPIE Optics + Photonics 2017 - San Diego, United States
Duration: 6 Aug 201710 Aug 2017
http://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/optics-and-photonics-2017

Conference

ConferenceSPIE Optics + Photonics 2017
CountryUnited States
CitySan Diego
Period06/08/201710/08/2017
Internet address
SeriesProceedings of S P I E - International Society for Optical Engineering
ISSN0277-786X

Keywords

  • Threat detection
  • Liquid threats
  • LAGs
  • EDXRD

Cite this

Kehres, J., Olsen, U. L., & Lyksborg, M. (2017). Threat detection of liquid explosives and precursors from their x-ray scattering pattern using energy dispersive detector technology. In Proc. SPIE 10403, Infrared Remote Sensing and Instrumentation XXV (Vol. 10391). [1039302] SPIE - International Society for Optical Engineering. Proceedings of S P I E - International Society for Optical Engineering https://doi.org/10.1117/12.2274519