Thin Film Analysis by Nanomechanical Infrared Spectroscopy

Andrea Casci Ceccacci; Alberto Cagliani; Paolo Marizza; Silvan Schmid; Anja Boisen

doi:10.1021/acsomega.9b00276

Thin Film Analysis by Nanomechanical Infrared Spectroscopy

Andrea Casci Ceccacci^*, Alberto Cagliani, Paolo Marizza, Silvan Schmid, Anja Boisen

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.

Original language	English
Journal	ACS Omega
Volume	4
Issue number	4
Pages (from-to)	7628-7635
DOIs	https://doi.org/10.1021/acsomega.9b00276
Publication status	Published - 2019

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@article{20f53e45d78847bb808208e9e636016a,

title = "Thin Film Analysis by Nanomechanical Infrared Spectroscopy",

abstract = "There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.",

author = "{Casci Ceccacci}, Andrea and Alberto Cagliani and Paolo Marizza and Silvan Schmid and Anja Boisen",

year = "2019",

doi = "10.1021/acsomega.9b00276",

language = "English",

volume = "4",

pages = "7628--7635",

journal = "ACS Omega",

issn = "2470-1343",

publisher = "ACS Publications",

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TY - JOUR

T1 - Thin Film Analysis by Nanomechanical Infrared Spectroscopy

AU - Casci Ceccacci, Andrea

AU - Cagliani, Alberto

AU - Marizza, Paolo

AU - Schmid, Silvan

AU - Boisen, Anja

PY - 2019

Y1 - 2019

N2 - There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.

AB - There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.

U2 - 10.1021/acsomega.9b00276

DO - 10.1021/acsomega.9b00276

M3 - Journal article

C2 - 31058251

VL - 4

SP - 7628

EP - 7635

JO - ACS Omega

JF - ACS Omega

SN - 2470-1343

IS - 4

ER -