Thickness-Dependent Properties of YBCO Films Grown on GZO/CLO-Buffered NiW Substrates

M. Malmivirta, H. Huhtinen, Zhao Yue, Jean-Claude Grivel, P. Paturi

Research output: Contribution to journalJournal articleResearchpeer-review


To study the role of novel Gd2Zr2O7/Ce0.9La0.1O2 buffer layer structure on a biaxially textured NiW substrate, a set of YBa2Cu3O7−δ (YBCO) films with different thicknesses were prepared by pulsed laser deposition (PLD). Interface imperfections as well as thickness-dependent structural properties were observed in the YBCO thin films. The structure is also reflected into the improved superconducting properties with the highest critical current densities in films with intermediate thicknesses. Therefore,it can be concluded that the existing buffer layers need more optimization before they can be successfully used for films with various thicknesses. This issue is linked to the extremely susceptible growth method of PLD when compared to the commonly used chemical deposition methods. Nevertheless, PLD-grown films can give a hint on what to concentrate to be able to further improve the buffer layer structures for future coated conductor technologies.
Original languageEnglish
JournalJournal of Low Temperature Physics
Issue number1
Pages (from-to)74-83
Number of pages10
Publication statusPublished - 2017


  • Pulsed laser deposition (PLD)
  • Technical substrate
  • Thickness dependence
  • YBCO thin films


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