Thickness-Dependent Properties of YBCO Films Grown on GZO/CLO-Buffered NiW Substrates

To study the role of novel Gd₂Zr₂O₇/Ce_0.9La_0.1O₂ buffer layer structure on a biaxially textured NiW substrate, a set of YBa₂Cu₃O_7−δ (YBCO) films with different thicknesses were prepared by pulsed laser deposition (PLD). Interface imperfections as well as thickness-dependent structural properties were observed in the YBCO thin films. The structure is also reflected into the improved superconducting properties with the highest critical current densities in films with intermediate thicknesses. Therefore,it can be concluded that the existing buffer layers need more optimization before they can be successfully used for films with various thicknesses. This issue is linked to the extremely susceptible growth method of PLD when compared to the commonly used chemical deposition methods. Nevertheless, PLD-grown films can give a hint on what to concentrate to be able to further improve the buffer layer structures for future coated conductor technologies.