Thermally induced frenkel disorder in UO//2 and ThO//2

J. Emyr Macdonald, Kurt Nørgaard Clausen, Barry Garrard, Michael A. Hackett, William Hayes, Raymond Osborn, Peter Schnabel, Michael T. Hutchings

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Frenkel defect formation in the oxygen sublattice and the excitation of electronic defects in the form of small polarons are considered. A brief summary is given of the results of a recent investigation into possible oxygen lattice disorder in UO//2 and ThO//2 at temperatures up to 2930 K, using neutron scattering techniques.
    Original languageEnglish
    JournalHigh Temperatures - High Pressures
    Volume17
    Issue number1
    Pages (from-to)27-29
    ISSN0018-1544
    Publication statusPublished - 1985

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