Abstract
The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffracton investigations.
| Original language | English |
|---|---|
| Journal | Materials Science Forum |
| Volume | 467-470 |
| Pages (from-to) | 1349-1354 |
| ISSN | 0255-5476 |
| Publication status | Published - 2004 |
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