Thermal stability of electrodeposited Ni and Ni-Co layers; an EBSD-study

Anette Alsted Rasmussen, A. Gholinia, P.W. Trimby, Marcel A.J. Somers

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffracton investigations.
    Original languageEnglish
    JournalMaterials Science Forum
    Volume467-470
    Pages (from-to)1349-1354
    ISSN0255-5476
    Publication statusPublished - 2004

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