Thermal stability of directly UV-written waveguides and devices

K. Kulstad; Mikael Svalgaard

doi:10.1109/ECOC.1998.732421

Thermal stability of directly UV-written waveguides and devices

K. Kulstad
, Mikael Svalgaard

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

323 Downloads (Orbit)

Abstract

Accelerated aging experiments of directly UV-written straight waveguides, s-bends and directional couplers have been made. The results show that these structures are nearly unaffected by thousands of thermal cycles between +22°C and +80°C

Original language	English
Title of host publication	Proceedings of the 24th European Conference on Optical Communication
Volume	Volume 1
Publisher	IEEE
Publication date	1998
Pages	33-34
ISBN (Print)	84-89900-14-0
DOIs	https://doi.org/10.1109/ECOC.1998.732421
Publication status	Published - 1998
Event	24th European Conference on Optical Communication - Madrid, Spain Duration: 20 Sept 1998 → 24 Sept 1998 Conference number: 24

Conference

Conference	24th European Conference on Optical Communication
Number	24
Country/Territory	Spain
City	Madrid
Period	20/09/1998 → 24/09/1998

Bibliographical note

Copyright 1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Access to Document

10.1109/ECOC.1998.732421

KajFinal published version, 203 KB

OpenUrl availability

Check availability in DTU Findit

Cite this

@inproceedings{1054582f9758404f948c2757393ee64b,

title = "Thermal stability of directly UV-written waveguides and devices",

abstract = "Accelerated aging experiments of directly UV-written straight waveguides, s-bends and directional couplers have been made. The results show that these structures are nearly unaffected by thousands of thermal cycles between +22°C and +80°C",

author = "K. Kulstad and Mikael Svalgaard",

note = "Copyright 1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.; 24th European Conference on Optical Communication, ECOC'98 ; Conference date: 20-09-1998 Through 24-09-1998",

year = "1998",

doi = "10.1109/ECOC.1998.732421",

language = "English",

isbn = "84-89900-14-0",

volume = "Volume 1",

pages = "33--34",

booktitle = "Proceedings of the 24th European Conference on Optical Communication",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Thermal stability of directly UV-written waveguides and devices

AU - Kulstad, K.

AU - Svalgaard, Mikael

N1 - Conference code: 24

PY - 1998

Y1 - 1998

N2 - Accelerated aging experiments of directly UV-written straight waveguides, s-bends and directional couplers have been made. The results show that these structures are nearly unaffected by thousands of thermal cycles between +22°C and +80°C

AB - Accelerated aging experiments of directly UV-written straight waveguides, s-bends and directional couplers have been made. The results show that these structures are nearly unaffected by thousands of thermal cycles between +22°C and +80°C

U2 - 10.1109/ECOC.1998.732421

DO - 10.1109/ECOC.1998.732421

M3 - Article in proceedings

SN - 84-89900-14-0

VL - Volume 1

SP - 33

EP - 34

BT - Proceedings of the 24th European Conference on Optical Communication

PB - IEEE

T2 - 24th European Conference on Optical Communication

Y2 - 20 September 1998 through 24 September 1998

ER -

Thermal stability of directly UV-written waveguides and devices

Abstract

Conference

Bibliographical note

Access to Document

OpenUrl availability

Fingerprint

Cite this