Thermal memory effects at the Pt vertical bar YSZ interface

Torben Jacobsen, Lasse Bay

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A current induced activation mechanism in the oxygen reaction on the Pt \ YSZ interface at 1000 degreesC is demonstrated by impedance measurements. It is shown that Pt point electrodes conditioned at high temperature retain their initial reactivity when cooled to 600 degreesC. At this temperature, the relative rate of the activation/deactivation mechanism is reduced considerably and the electrode stability is sufficient for kinetic studies.
Original languageEnglish
JournalElectrochimica Acta
Volume47
Issue number13-14
Pages (from-to)2177-2181
ISSN0013-4686
Publication statusPublished - 2002

Cite this

Jacobsen, T., & Bay, L. (2002). Thermal memory effects at the Pt vertical bar YSZ interface. Electrochimica Acta, 47(13-14), 2177-2181.