Abstract
Starting from a general theory of time-resolved x-ray scattering, we derive a convenient expression for the diffraction signal based on a careful analysis of the relevant inelastic scattering processes. We demonstrate that the resulting inelastic limit applies to a wider variety of experimental conditions than similar, previously derived formulas, and it directly allows the application of selection rules when interpreting diffraction signals. Furthermore, we present a simple extension to systems simultaneously illuminated by x rays and a laser beam.
Original language | English |
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Journal | Physical Review A |
Volume | 81 |
Issue number | 2 |
Pages (from-to) | 023422 |
ISSN | 2469-9926 |
DOIs | |
Publication status | Published - 2010 |