Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

Tommi Laitinen; Sergey Pivnenko; Jeppe Majlund Nielsen; Olav Breinbjerg

doi:10.1109/TAP.2010.2050437

Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

Tommi Laitinen, Sergey Pivnenko, Jeppe Majlund Nielsen, Olav Breinbjerg

Aalto University

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.

Original language	English
Journal	I E E E Transactions on Antennas and Propagation
Volume	58
Issue number	8
Pages (from-to)	2623-2631
ISSN	0018-926X
DOIs	https://doi.org/10.1109/TAP.2010.2050437
Publication status	Published - 2010

Bibliographical note

Copyright: 20010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

Keywords

high-order probe
antenna measurements
near-field scanning

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10.1109/TAP.2010.2050437

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@article{584cdc0ae2b44f9ba0c0c1fa1190a505,

title = "Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes",

abstract = "A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.",

keywords = "high-order probe, antenna measurements, near-field scanning",

author = "Tommi Laitinen and Sergey Pivnenko and Nielsen, {Jeppe Majlund} and Olav Breinbjerg",

note = "Copyright: 20010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE",

year = "2010",

doi = "10.1109/TAP.2010.2050437",

language = "English",

volume = "58",

pages = "2623--2631",

journal = "I E E E Transactions on Antennas and Propagation",

issn = "0018-926X",

publisher = "Institute of Electrical and Electronics Engineers",

number = "8",

}

Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes. / Laitinen, Tommi; Pivnenko, Sergey; Nielsen, Jeppe Majlund et al.
In: I E E E Transactions on Antennas and Propagation, Vol. 58, No. 8, 2010, p. 2623-2631.

Research output: Contribution to journal › Journal article › Research › peer-review

TY - JOUR

T1 - Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

AU - Laitinen, Tommi

AU - Pivnenko, Sergey

AU - Nielsen, Jeppe Majlund

AU - Breinbjerg, Olav

N1 - Copyright: 20010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

PY - 2010

Y1 - 2010

N2 - A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.

AB - A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.

KW - high-order probe

KW - antenna measurements

KW - near-field scanning

U2 - 10.1109/TAP.2010.2050437

DO - 10.1109/TAP.2010.2050437

M3 - Journal article

SN - 0018-926X

VL - 58

SP - 2623

EP - 2631

JO - I E E E Transactions on Antennas and Propagation

JF - I E E E Transactions on Antennas and Propagation

IS - 8

ER -

Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

Abstract

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Keywords

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