Theory and practice of the FFT/matrix inversion technique for probe-corrected spherical near-field antenna measurements with high-order probes

Tommi Laitinen, Sergey Pivnenko, Jeppe Majlund Nielsen, Olav Breinbjerg

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Abstract

A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.
Original languageEnglish
JournalI E E E Transactions on Antennas and Propagation
Volume58
Issue number8
Pages (from-to)2623-2631
ISSN0018-926X
DOIs
Publication statusPublished - 2010

Bibliographical note

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Keywords

  • high-order probe
  • antenna measurements
  • near-field scanning

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