Theoretical study of ferroelectric nanoparticles using phase reconstructed electron microscopy

C. Phatak, A. K. Petford-Long, Marco Beleggia, M. De Graef

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    Abstract

    Ferroelectric nanostructures are important for a variety of applications in electronic and electro-optical devices, including nonvolatile memories and thin-film capacitors. These applications involve stability and switching of polarization using external stimuli, such as electric fields. We present a theoretical model describing how the shape of a nanoparticle affects its polarization in the absence of screening charges, and quantify the electron-optical phase shift for detecting ferroelectric signals with phase-sensitive techniques in a transmission electron microscope. We provide an example phase shift computation for a uniformly polarized prolate ellipsoid with varying aspect ratio in the absence of screening charges.
    Original languageEnglish
    JournalPhysical Review B
    Volume89
    Issue number21
    Pages (from-to)214112
    Number of pages5
    ISSN0163-1829
    DOIs
    Publication statusPublished - 2014

    Bibliographical note

    ©2014 American Physical Society

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