Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials

Robert S. Pennington; Jens Jørgen Mortensen; Takeshi Kasama; Chris Boothroyd; Rafal E. Dunin-Borkowski

doi:10.1088/1742-6596/209/1/012030

Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials

Robert S. Pennington, Jens Jørgen Mortensen, Takeshi Kasama, Chris Boothroyd, Rafal E. Dunin-Borkowski

Department of Physics

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

We use density functional theory to explore the effect on calculations of semiconductor mean inner potentials of the presence of reconstructions, changes in lattice spacing and adsorbates on the surfaces of parallel-sided thin specimens. We also use electron holography to illustrate several factors that affect experimental measurements of mean inner potentials of semiconductor nanowires.

Original language	English
Book series	Journal of Physics: Conference Series (Online)
Volume	209
Issue number	1
Pages (from-to)	012030
ISSN	1742-6596
DOIs	https://doi.org/10.1088/1742-6596/209/1/012030
Publication status	Published - 2010
Event	16th International Conference on Microscopy of Semiconducting Materials - University of Oxford, Oxford, United Kingdom Duration: 17 Mar 2009 → 20 Mar 2009 Conference number: 16

Conference

Conference	16th International Conference on Microscopy of Semiconducting Materials
Number	16
Location	University of Oxford
Country/Territory	United Kingdom
City	Oxford
Period	17/03/2009 → 20/03/2009

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10.1088/1742-6596/209/1/012030

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AU - Mortensen, Jens Jørgen

AU - Kasama, Takeshi

AU - Boothroyd, Chris

AU - Dunin-Borkowski, Rafal E.

N1 - Conference code: 16

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AB - We use density functional theory to explore the effect on calculations of semiconductor mean inner potentials of the presence of reconstructions, changes in lattice spacing and adsorbates on the surfaces of parallel-sided thin specimens. We also use electron holography to illustrate several factors that affect experimental measurements of mean inner potentials of semiconductor nanowires.

U2 - 10.1088/1742-6596/209/1/012030

DO - 10.1088/1742-6596/209/1/012030

M3 - Conference article

SN - 1742-6596

VL - 209

SP - 012030

JO - Journal of Physics: Conference Series (Online)

JF - Journal of Physics: Conference Series (Online)

IS - 1

T2 - 16th International Conference on Microscopy of Semiconducting Materials

Y2 - 17 March 2009 through 20 March 2009

ER -

Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials

Abstract

Conference

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