The XGIS instrument on-board THESEUS: The detection plane and on-board electronics

F. Fuschino, R. Campana, C. Labanti, L. Amati, E. Virgilli, L. Terenzi, P. Bellutti, G. Bertuccio, G. Borghi, L. C. Bune Jensen, F. Ficorella, M. Gandola, A. Gemelli, M. Grassi, P. Hedderman, I. Kuvvetli, G. la Rosa, P. Lorenzi, P. Malcovati, F. MeleP. Orleanski, M. Pedersen, A. Picciotto, A. Rachevski, I. Rashevskaya, A. Santangelo, P. Sarra, G. Sottile, D. Tcherniak, C. Tenzer, A. Vacchi, M. Winkler, G. Zampa, N. Zampa, N. Zorzi

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Abstract

The X and Gamma Imaging Spectrometer instrument on-board the THESEUS mission (selected by ESA in the framework of the Cosmic Vision M5 launch opportunity, currently in phase A) is based on a detection plane composed of several thousands of single active elements. Each element comprises a 4.5×4.5×30 mm3 CsI(Tl) scintillator bar, optically coupled at both ends to Silicon Drift Detectors (SDDs). The SDDs acts both as photodetectors for the scintillation light and as direct X-ray sensors. In this paper the design of the XGIS detection plane is reviewed, outlining the strategic choices in terms of modularity and redundancy of the system. Results on detector-electronics prototypes are also described. Moreover, the design and development of the low-noise front-end electronics is presented, emphasizing the innovative architectural design based on custom-designed Application-Specific Integrated Circuits (ASICs).
Original languageEnglish
Title of host publicationSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
Number of pages15
Volume11444
PublisherSPIE - International Society for Optical Engineering
Publication date2020
Article number114448R
DOIs
Publication statusPublished - 2020
EventSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray - Online event
Duration: 14 Dec 202018 Dec 2020

Conference

ConferenceSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
LocationOnline event
Period14/12/202018/12/2020
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume11444
ISSN0277-786X

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