The VERT-X calibration facility: development of the most critical parts

  • A. Moretti*
  • , D. Spiga
  • , S. Basso
  • , G. Sironi
  • , G. Pareschi
  • , V. Cotroneo
  • , M. Civitani
  • , M. Ghigo
  • , P. Pecoraro
  • , N. La Palombara
  • , M. Uslenghi
  • , G. Valsecchi
  • , F. Marioni
  • , D. Vernani
  • , M. Rossi
  • , F. Zocchi
  • , G. Parodi
  • , M. Ottolini
  • , M. Tordi
  • , S. de Lorenzi
  • R. Bressan, F. Amisano, S. Coleman, J. Burnett, V. Burwitz, S. Massahi, D. Della Monica Ferreira, P. Corradi, P. Smid, M. Bavdaz, I. Ferreira
*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

The ground calibration of the NewATHENA mirror poses significant challenges owing to its unprecedented size, mass, and focal length. VERT-X is an innovative calibration facility designed to tackle this exceptionally demanding task. It relies on an X-ray parallel beam, generated by a micro-focus source positioned at the focus of an X-ray collimator. A raster-scan mechanism enables the beam movement, covering all NewATHENA optics at varying off-axis angles. The compactness of the concept offers several benefits, including the vertical geometry which implies minimal PSF degradation due to lateral gravity. Furthermore, this allows for a flexible choice of location. Indeed one of the most important feature of VERT-X is its contiguity with the mirror integration facility. The driving factor in the VERT-X design is to meet the NewATHENA calibration requirement for Half- Energy Width (HEW) accuracy at 0.1”. Key contributors to the error budget in the VERT-X design include the source size, collimator error, and raster-scan pointing accuracy. This paper provides an overview of the current status of the development of these critical parts.
Original languageEnglish
Title of host publicationSpace Telescopes and Instrumentation 2024 : Ultraviolet to Gamma Ray
EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
Number of pages6
Volume13093
PublisherSPIE - The International Society for Optical Engineering
Publication date2024
Article number130934Q
DOIs
Publication statusPublished - 2024
EventSPIE Astronomical Telescopes + Instrumentation 2024 - Yokohama, Japan
Duration: 16 Jun 202421 Jun 2024

Conference

ConferenceSPIE Astronomical Telescopes + Instrumentation 2024
Country/TerritoryJapan
CityYokohama
Period16/06/202421/06/2024
SeriesProceedings of SPIE - The International Society for Optical Engineering
ISSN0277-786X

Keywords

  • Astronomy
  • ATHENA
  • Calibration
  • Facility
  • Optics
  • X-ray

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