Abstract
The ground calibration of the NewATHENA mirror poses significant challenges owing to its unprecedented size, mass, and focal length. VERT-X is an innovative calibration facility designed to tackle this exceptionally demanding task. It relies on an X-ray parallel beam, generated by a micro-focus source positioned at the focus of an X-ray collimator. A raster-scan mechanism enables the beam movement, covering all NewATHENA optics at varying off-axis angles. The compactness of the concept offers several benefits, including the vertical geometry which implies minimal PSF degradation due to lateral gravity. Furthermore, this allows for a flexible choice of location. Indeed one of the most important feature of VERT-X is its contiguity with the mirror integration facility. The driving factor in the VERT-X design is to meet the NewATHENA calibration requirement for Half- Energy Width (HEW) accuracy at 0.1”. Key contributors to the error budget in the VERT-X design include the source size, collimator error, and raster-scan pointing accuracy. This paper provides an overview of the current status of the development of these critical parts.
| Original language | English |
|---|---|
| Title of host publication | Space Telescopes and Instrumentation 2024 : Ultraviolet to Gamma Ray |
| Editors | Jan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa |
| Number of pages | 6 |
| Volume | 13093 |
| Publisher | SPIE - The International Society for Optical Engineering |
| Publication date | 2024 |
| Article number | 130934Q |
| DOIs | |
| Publication status | Published - 2024 |
| Event | SPIE Astronomical Telescopes + Instrumentation 2024 - Yokohama, Japan Duration: 16 Jun 2024 → 21 Jun 2024 |
Conference
| Conference | SPIE Astronomical Telescopes + Instrumentation 2024 |
|---|---|
| Country/Territory | Japan |
| City | Yokohama |
| Period | 16/06/2024 → 21/06/2024 |
| Series | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| ISSN | 0277-786X |
Keywords
- Astronomy
- ATHENA
- Calibration
- Facility
- Optics
- X-ray