The spatial degree of polarization and the first-order statistical properties of polarization speckle

W. Wang; A. Matsuda; Steen Grüner Hanson; M. Takeda

doi:10.1117/12.792843

The spatial degree of polarization and the first-order statistical properties of polarization speckle

W. Wang, A. Matsuda, Steen Grüner Hanson, M. Takeda

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Interferometry 14: Techniques and analysis
Editors	J. Schmit, K. Creath, C.E. Towers
Place of Publication	Bellingham
Publisher	International Society for Optical Engineering
Publication date	2008
DOIs	https://doi.org/10.1117/12.792843
Publication status	Published - 2008
Event	International Conference on Optics and Photonics 2008 - San Diego, CA, United States Duration: 10 Aug 2008 → 14 Aug 2008 http://spie.org/x27421.xml

Conference

Conference	International Conference on Optics and Photonics 2008
Country/Territory	United States
City	San Diego, CA
Period	10/08/2008 → 14/08/2008
Internet address	http://spie.org/x27421.xml

Series	SPIE Proceedings Series, 7063

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10.1117/12.792843

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Cite this

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title = "The spatial degree of polarization and the first-order statistical properties of polarization speckle",

author = "W. Wang and A. Matsuda and Hanson, {Steen Gr{\"u}ner} and M. Takeda",

year = "2008",

doi = "10.1117/12.792843",

language = "English",

series = "SPIE Proceedings Series, 7063",

editor = "J. Schmit and K. Creath and C.E. Towers",

booktitle = "Interferometry 14: Techniques and analysis",

publisher = "International Society for Optical Engineering",

note = "International Conference on Optics and Photonics 2008 ; Conference date: 10-08-2008 Through 14-08-2008",

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Wang, W, Matsuda, A, Hanson, SG & Takeda, M 2008, The spatial degree of polarization and the first-order statistical properties of polarization speckle. in J Schmit, K Creath & CE Towers (eds), Interferometry 14: Techniques and analysis. International Society for Optical Engineering, Bellingham, SPIE Proceedings Series, 7063, International Conference on Optics and Photonics 2008, San Diego, CA, United States, 10/08/2008. https://doi.org/10.1117/12.792843

The spatial degree of polarization and the first-order statistical properties of polarization speckle. / Wang, W.; Matsuda, A.; Hanson, Steen Grüner et al.

Interferometry 14: Techniques and analysis. ed. / J. Schmit; K. Creath; C.E. Towers. Bellingham : International Society for Optical Engineering, 2008. (SPIE Proceedings Series, 7063).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - The spatial degree of polarization and the first-order statistical properties of polarization speckle

AU - Wang, W.

AU - Matsuda, A.

AU - Hanson, Steen Grüner

AU - Takeda, M.

PY - 2008

Y1 - 2008

U2 - 10.1117/12.792843

DO - 10.1117/12.792843

M3 - Article in proceedings

T3 - SPIE Proceedings Series, 7063

BT - Interferometry 14: Techniques and analysis

A2 - Schmit, J.

A2 - Creath, K.

A2 - Towers, C.E.

PB - International Society for Optical Engineering

CY - Bellingham

T2 - International Conference on Optics and Photonics 2008

Y2 - 10 August 2008 through 14 August 2008

ER -