The spatial degree of polarization and the first-order statistical properties of polarition speckle

Wei Wang; Akihiro Matsuda; Steen Grüner Hanson; Mitsu Takeda

The spatial degree of polarization and the first-order statistical properties of polarition speckle

Wei Wang, Akihiro Matsuda, Steen Grüner Hanson, Mitsu Takeda

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Interferometry 14 : Techniques and Analysis
Editors	Joanna Shmit, Katherine Creath, Catherine E. Towers
Volume	70630B
Place of Publication	Bellingham
Publisher	SPIE - International Society for Optical Engineering
Publication date	2008
Publication status	Published - 2008
Event	International Conference on Optics and Photonics 2008 - San Diego, CA, United States Duration: 10 Aug 2008 → 14 Aug 2008 http://spie.org/x27421.xml

Conference

Conference	International Conference on Optics and Photonics 2008
Country/Territory	United States
City	San Diego, CA
Period	10/08/2008 → 14/08/2008
Internet address	http://spie.org/x27421.xml

Series	Proceedings of SPIE - The International Society for Optical Engineering
ISSN	0277-786X

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Wang, Wei ; Matsuda, Akihiro ; Hanson, Steen Grüner et al. / The spatial degree of polarization and the first-order statistical properties of polarition speckle. Interferometry 14: Techniques and Analysis. editor / Joanna Shmit ; Katherine Creath ; Catherine E. Towers. Vol. 70630B Bellingham : SPIE - International Society for Optical Engineering, 2008. (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "The spatial degree of polarization and the first-order statistical properties of polarition speckle",

author = "Wei Wang and Akihiro Matsuda and Hanson, {Steen Gr{\"u}ner} and Mitsu Takeda",

year = "2008",

language = "English",

volume = "70630B",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE - International Society for Optical Engineering",

editor = "Joanna Shmit and Katherine Creath and Towers, {Catherine E.}",

booktitle = "Interferometry 14",

note = "International Conference on Optics and Photonics 2008 ; Conference date: 10-08-2008 Through 14-08-2008",

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Wang, W, Matsuda, A, Hanson, SG & Takeda, M 2008, The spatial degree of polarization and the first-order statistical properties of polarition speckle. in J Shmit, K Creath & CE Towers (eds), Interferometry 14: Techniques and Analysis. vol. 70630B, SPIE - International Society for Optical Engineering, Bellingham, Proceedings of SPIE - The International Society for Optical Engineering, International Conference on Optics and Photonics 2008, San Diego, CA, United States, 10/08/2008.

The spatial degree of polarization and the first-order statistical properties of polarition speckle. / Wang, Wei; Matsuda, Akihiro; Hanson, Steen Grüner et al.
Interferometry 14: Techniques and Analysis. ed. / Joanna Shmit; Katherine Creath; Catherine E. Towers. Vol. 70630B Bellingham: SPIE - International Society for Optical Engineering, 2008. (Proceedings of SPIE - The International Society for Optical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - The spatial degree of polarization and the first-order statistical properties of polarition speckle

AU - Wang, Wei

AU - Matsuda, Akihiro

AU - Hanson, Steen Grüner

AU - Takeda, Mitsu

PY - 2008

Y1 - 2008

M3 - Article in proceedings

VL - 70630B

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Interferometry 14

A2 - Shmit, Joanna

A2 - Creath, Katherine

A2 - Towers, Catherine E.

PB - SPIE - International Society for Optical Engineering

CY - Bellingham

T2 - International Conference on Optics and Photonics 2008

Y2 - 10 August 2008 through 14 August 2008

ER -

Wang W, Matsuda A, Hanson SG, Takeda M. The spatial degree of polarization and the first-order statistical properties of polarition speckle. In Shmit J, Creath K, Towers CE, editors, Interferometry 14: Techniques and Analysis. Vol. 70630B. Bellingham: SPIE - International Society for Optical Engineering. 2008. (Proceedings of SPIE - The International Society for Optical Engineering).