The role of electron-stimulated desorption in focused electron beam induced deposition

Willem F. van Dorp, Thomas Willum Hansen, Jakob Birkedal Wagner, Jeff T. M. De Hosson

    Research output: Contribution to journalJournal articleResearchpeer-review

    238 Downloads (Pure)

    Abstract

    We present the results of our study about the deposition rate of focused electron beam induced processing (FEBIP) as a function of the substrate temperature with the substrate being an electron-transparent amorphous carbon membrane. When W(CO)6 is used as a precursor it is observed that the growth rate is lower at higher substrate temperatures. From Arrhenius plots we calculated the activation energy for desorption, Edes, of W(CO)6. We found an average value for Edes of 20.3 kJ or 0.21 eV, which is 2.5–3.0 times lower than literature values. This difference between estimates for Edes from FEBIP experiments compared to literature values is consistent with earlier findings by other authors. The discrepancy is attributed to electron-stimulated desorption, which is known to occur during electron irradiation. The data suggest that, of the W(CO)6 molecules that are affected by the electron irradiation, the majority desorbs from the surface rather than dissociates to contribute to the deposit. It is important to take this into account during FEBIP experiments, for instance when determining fundamental process parameters such as the activation energy for desorption.
    Original languageEnglish
    JournalBeilstein Journal of Nanotechnology
    Volume2013
    Issue number4
    Pages (from-to)474–480
    DOIs
    Publication statusPublished - 2013

    Bibliographical note

    This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

    Fingerprint Dive into the research topics of 'The role of electron-stimulated desorption in focused electron beam induced deposition'. Together they form a unique fingerprint.

    Cite this