The objective crystal spectrometer OXS on the spectrum-X-gamma satellite crystal calibrations

S. Abdali, Finn Erland Christensen, H.W. Schnopper, Leif Gerward, H.-J. Wiebicke, I. Halm, E. Louis, H.-J. Voorma, E. Spiller, C. Tarro

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

The four kinds of crystals; RAP(001), Si(111), LiF(220) and the Co/C multilayer on the super polished Si(111) crystals, together make up the objective crystal spectrometer OXS. They cover a wide energy range extending from 0.16 eV to 8 keV. A study of crystal reflectivity and energy resolution including measurements on RAP, LiF and Co/C and a calculation of Si crystals in the respective wavelength bands has been performed and the results are presented.
Original languageEnglish
JournalProceedings of S P I E - International Society for Optical Engineering
Volume3114
Pages (from-to)358-372
ISSN0277-786X
DOIs
Publication statusPublished - 1997
EventEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII - San Diego, CA., United States
Duration: 27 Jul 199727 Jul 1997

Conference

ConferenceEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
CountryUnited States
CitySan Diego, CA.
Period27/07/199727/07/1997

Cite this

Abdali, S., Christensen, F. E., Schnopper, H. W., Gerward, L., Wiebicke, H-J., Halm, I., Louis, E., Voorma, H-J., Spiller, E., & Tarro, C. (1997). The objective crystal spectrometer OXS on the spectrum-X-gamma satellite crystal calibrations. Proceedings of S P I E - International Society for Optical Engineering, 3114, 358-372. https://doi.org/10.1117/12.283779