The interface structure of directly bonded Si(001) wafers, studied by X-ray diffraction

M. Nielsen, R. Feidenhans'l, P.B. Howes, F. Grey, S. Weichel, J. Vedde

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationProgramme and abstracts
    Number of pages3
    Place of PublicationLondon
    PublisherInstitute of Physics
    Publication date1999
    Publication statusPublished - 1999
    EventCondensed matter and materials physics conference (CMMP '99) - Leicester (GB), 19-22 Dec
    Duration: 1 Jan 1999 → …


    ConferenceCondensed matter and materials physics conference (CMMP '99)
    CityLeicester (GB), 19-22 Dec
    Period01/01/1999 → …

    Cite this