The interface structure of directly bonded Si crystals, studied by synchrotron x-ray diffraction

P.B. Howes

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1998
    Publication statusPublished - 1998
    Event9th International Conference on Solid Films and Surfaces - København, Denmark
    Duration: 6 Jul 199810 Jul 1998

    Conference

    Conference9th International Conference on Solid Films and Surfaces
    CountryDenmark
    CityKøbenhavn
    Period06/07/199810/07/1998

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