The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction

M. Nielsen; R. Feidenhans'l; P.B. Howes; F. Grey; K. Rasmussen; J. Vedde

The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction

M. Nielsen, R. Feidenhans'l, P.B. Howes, F. Grey, K. Rasmussen, J. Vedde

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Invited and contributed papers
Editors	N.Q. Lam, C.A. Melendres, S.K. Sinha
Place of Publication	North East, MD (US)
Publisher	IASI Press
Publication date	2000
Pages	139-147
ISBN (Print)	0-9701790-0-6
Publication status	Published - 2000
Event	Advanced Studies Institute on exploration of subsurface phenomena by particle scattering - Monterey, United States Duration: 19 Oct 1998 → 23 Oct 1998

Conference

Conference	Advanced Studies Institute on exploration of subsurface phenomena by particle scattering
Country/Territory	United States
City	Monterey
Period	19/10/1998 → 23/10/1998

Series	Science and technology series

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Cite this

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title = "The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction",

keywords = "Nye funktionelle materialer",

author = "M. Nielsen and R. Feidenhans'l and P.B. Howes and F. Grey and K. Rasmussen and J. Vedde",

year = "2000",

language = "English",

isbn = "0-9701790-0-6",

series = "Science and technology series",

pages = "139--147",

editor = "N.Q. Lam and C.A. Melendres and S.K. Sinha",

booktitle = "Invited and contributed papers",

publisher = "IASI Press",

note = "Advanced Studies Institute on exploration of subsurface phenomena by particle scattering ; Conference date: 19-10-1998 Through 23-10-1998",

}

Nielsen, M, Feidenhans'l, R, Howes, PB, Grey, F, Rasmussen, K & Vedde, J 2000, The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction. in NQ Lam, CA Melendres & SK Sinha (eds), Invited and contributed papers. IASI Press, North East, MD (US), Science and technology series, pp. 139-147, Advanced Studies Institute on exploration of subsurface phenomena by particle scattering, Monterey, California, United States, 19/10/1998.

The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction. / Nielsen, M.; Feidenhans'l, R.; Howes, P.B. et al.
Invited and contributed papers. ed. / N.Q. Lam; C.A. Melendres; S.K. Sinha. North East, MD (US): IASI Press, 2000. p. 139-147 (Science and technology series).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - The interface of directly-bonded Si crystals studied by synchrotron X-ray diffraction

AU - Nielsen, M.

AU - Feidenhans'l, R.

AU - Howes, P.B.

AU - Grey, F.

AU - Rasmussen, K.

AU - Vedde, J.

PY - 2000

Y1 - 2000

KW - Nye funktionelle materialer

M3 - Article in proceedings

SN - 0-9701790-0-6

T3 - Science and technology series

SP - 139

EP - 147

BT - Invited and contributed papers

A2 - Lam, N.Q.

A2 - Melendres, C.A.

A2 - Sinha, S.K.

PB - IASI Press

CY - North East, MD (US)

T2 - Advanced Studies Institute on exploration of subsurface phenomena by particle scattering

Y2 - 19 October 1998 through 23 October 1998

ER -