The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Programme. Abstracts. List of participants
Place of Publication	København
Publisher	HCØ Tryk
Publication date	2000
ISBN (Print)	87-7834-385-2
Publication status	Published - 2000
Event	Danish Physical Society Annual Meeting 2000 - Nyborg, Denmark Duration: 8 Jun 2000 → 9 Jun 2000

Conference	Danish Physical Society Annual Meeting 2000
Country/Territory	Denmark
City	Nyborg
Period	08/06/2000 → 09/06/2000

OpenUrl availability

@inbook{ce537e0055384bf9aea05dc0ddaf0913,

title = "The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction",

keywords = "Nye funktionelle materialer",

author = "M. Poulsen and M. Nielsen and R. Feidenhans'l and C. Kumpf and F. Grey and S. Weichel and J. Vedde and P.B. Howes",

year = "2000",

language = "English",

isbn = "87-7834-385-2",

booktitle = "Programme. Abstracts. List of participants",

publisher = "HC{\O} Tryk",

note = "Danish Physical Society Annual Meeting 2000 ; Conference date: 08-06-2000 Through 09-06-2000",

}

TY - ABST

T1 - The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

AU - Poulsen, M.

AU - Nielsen, M.

AU - Feidenhans'l, R.

AU - Kumpf, C.

AU - Grey, F.

AU - Weichel, S.

AU - Vedde, J.

AU - Howes, P.B.

PY - 2000

Y1 - 2000

KW - Nye funktionelle materialer

M3 - Conference abstract in proceedings

SN - 87-7834-385-2

BT - Programme. Abstracts. List of participants

PB - HCØ Tryk

CY - København

T2 - Danish Physical Society Annual Meeting 2000

Y2 - 8 June 2000 through 9 June 2000

ER -