The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

M. Nielsen, M. Poulsen, R. Feidenhans'l, C. Kumpf, F. Grey, S. Weichel, J. Vedde, P.B. Howes

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationProgramme and abstracts
    Place of PublicationCopenhagen
    PublisherCentre for Crystallographic Studies
    Publication date2000
    Publication statusPublished - 2000
    Event31. Danske krystallografmøde; Dansync's 3. Årsmøde - København, Denmark
    Duration: 30 May 200031 May 2000


    Conference31. Danske krystallografmøde; Dansync's 3. Årsmøde

    Cite this